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  1. Probe Card - Test Sockets - PCB Solutions for Semiconductor Wafer and Device Test by APS

    APS provides Probecards for Wafer Probing, Test Sockets for IC Component Test, and Multilayer PCB for Wafer-, Device- and IC Test
    pcb2
    SBS2
    shelf2
    APS2
    tungsten1
    Printed Circuit Board1
    cantilever1
    Multilayer1
    contactor1
    MJC1
    spring pin1
    fine pitch1
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    probe card1
    IC Test1
    Probecard1
    test contactor1
    Wafer Test1
    Device Test1
    Prüfkarten1
    probe needles1
    vertical probe card1
    epoxy ring1
    testsocket1
    kelvin socket0
    multi DUT0
    Performance Board0
    rhenium-tungsten0
    strip test socket0
    Synergie CAD0
    tungsten-rhenium0

    www.aps-munich.com - 2009-02-12

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